5

Trap-limited migration of vacancy-type defects in 7.5 keV H[sup −]-implanted Si

Year:
2002
Language:
english
File:
PDF, 363 KB
english, 2002
9

DLTS of low-energy hydrogen ion implanted n-Si

Year:
2003
Language:
english
File:
PDF, 213 KB
english, 2003
24

Electrical transients in the ion-beam-induced nitridation of silicon

Year:
2001
Language:
english
File:
PDF, 239 KB
english, 2001